Introduction
In the semiconductor industry, Wafer Test / Probe is a critical stage for validating chip functionality before dicing. High-speed, precision-controlled test equipment requires a reliable computing platform to manage motion control, data acquisition, and real-time system integration. That’s where the EPC-102A, an industrial PC for Wafer Test / Probe, becomes essential.
Application Background
A leading semiconductor testing service provider needed to upgrade their probe station controller. Their goals were:
- Faster test response and data processing
- Compatibility with motion control cards and DAQ hardware
- Long-term operation with industrial reliability
- Seamless integration with MES and ATE systems
Why EPC-102A?
The CESIPC EPC-102A was selected as the central controller for their advanced Wafer Probing System.
Key Features:
- Intel® 12th Gen Core™ CPU (i5/i7 options)
- Fanless aluminum chassis for cleanroom environments
- Rich I/O: 6×USB, 3×COM, dual LAN, optional GPIO
- Wide voltage input: 9V–36V with 3-pin Phoenix connector
- Support for PCIe motion cards and frame grabbers
- Compact and mount-friendly design for integration into test benches
System Deployment
In this case, the EPC-102A controlled the probe station’s XYZ motion via an EtherCAT PCIe motion control card. The system also handled:
- Real-time synchronization with ATE hardware
- Data logging through a high-speed SSD
- Image capture and alignment through an integrated industrial camera
- Direct upload to the customer’s MES for yield analysis
Results & Benefits-Industrial PC for Wafer Test / Probe
| Improvement | Details |
|---|---|
| ✅ Faster Probe Test Cycles | Cut test time by ~20% through improved motion latency |
| ✅ High System Stability | 24/7 uptime with zero thermal throttling over 6 months |
| ✅ Cleanroom Ready | Fanless, dust-free design ideal for ISO Class 5+ environments |
| ✅ Flexible Expansion | PCIe and serial ports accommodated legacy and modern modules |
Industries Benefiting from EPC-102A
- Wafer Foundries (e.g., TSMC, SMIC)
- IC Packaging and Test Houses (e.g., ASE, JCET)
- Semiconductor Equipment Manufacturers
Conclusion
Whether you’re upgrading legacy testers or designing new probe stations, the EPC-102A is a reliable industrial PC for Wafer Test / Probe applications. With robust performance, long lifecycle support, and flexible integration, it enables precision testing at the heart of semiconductor quality control.
Contact CESIPC Team
